Electron microscopy - EM Analytical

Electron microscopy provides single-nanometer resolution imaging for the ultimate level of detail. Whether you’re interested in the internal structure of cells or nano-electronic devices, electron microscopy will give you direct visual characterisation of the smallest structures.

We have a range of electron microscopes suitable for anything from high-throughput quality control to in-depth failure analysis and high resolution R&D. Our flexible approach means we can mix-and-match our instrumentation to meet your requirements.

Leo 1430 variable pressure scanning electron microscope (SEM)

Scanning electron microscopy

Scanning electron microscopes (SEMs) are used to image the sample surface at up to 500,000X magnification. We have a range of SEMs equipped with a variety of detectors to give a wealth of supporting information.

Leo 1550

- Thermal field emission (TFE) for better than 10 nanometer resolution.
- Secondary Electron (SE) and InLens detector for high resolution surface-sensitive imaging.
- 4-quarter Backscatter electron detector (BSD) for contrast from different materials.
- Electron Backscatter Diffraction (EBSD) for grain orientation mapping and quantitative crystallography.
- Scanning Transmission Electron Microscopy detector (STEM) for imaging electron-transparent samples and nanoparticles. Read our nanoparticle case study to find out more.
- Energy-Dispersive X-ray spectroscopy (EDX) for qualitative and quantitative elemental composition analysis, including point ID and mapping. Read more about elemental characterisation with EDX here.

Leo 1430 VP

- - Variable pressure for imaging non-conductive samples without the need for coating.
  - Secondary electron (SE) detector for surface-sensitive imaging.
  - 4-quarter backscatter electron detector (BSD) for contrast from different materials.
  - Energy-Dispersive X-ray spectroscopy (EDX) for qualitative and quantitative elemental composition analysis, including point ID and mapping. Read more about elemental characterisation with EDX here.

Philips XL30

- - Cryo-SEM for imaging hydrated samples without distortions from dehydration, freeze-drying or chemical fixing.
  - 4-quarter backscatter electron detector (BSD) with live 3D topography imaging.
  - Secondary electron (SE) detector for surface-sensitive imaging.
  - Point Electronic DISS5 Digital Image Capture (DIC) with dual-signal imaging.

Philips CM100 transmission electron microscope (TEM)

Transmission electron microscopy

Our TEMs are ideal for ultra-high-resolution imaging of materials from biological samples such as cells, nanoparticles and individual hydrogel fibres, through to solid state materials, metallurgy and crystallography.

Philips CM100

- - 40 – 100 kV with a LaB₆ source for single nanometer resolution with minimal damage to beam sensitive materials.
  - Megaview II side-mounted camera with wide field of view.
  - Dark field and diffraction mode for crystallographic analysis.

Philips CM20

- - 200 kV with a LaB₆ source for single nanometer resolution.
  - Gatan Ultrascan 2K x 2K high resolution camera.
  - Dark field and diffraction mode for crystallographic analysis.

Sample preparation

We have a full suite of sample preparation equipment for all kinds of samples, from biological specimens to electronics and metallography.

- - Sputter coating of carbon, gold or palladium to improve the resolution of non-conductive samples.
  - Ultra-microtome, resin embedding and sectioning between 30 – 100 nanometers thick for TEM samples.
  - Grinding and polishing for surface preparation of SEM samples and thinning of TEM samples.
  - Alpha Plasma AL-18 for oxygen/argon plasma cleaning and decapsulation.
  - Optical microscopy for finding the area of interest and evaluating sample preparation.

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