Electron microscopy

Electron microscopy provides single-nanometer resolution imaging for the ultimate level of detail. Whether you’re interested in the internal structure of cells or nano-electronic devices, electron microscopy will give you direct visual characterisation of the smallest structures.

We have a range of electron microscopes suitable for anything from high-throughput quality control to in-depth failure analysis and high resolution R&D. Our flexible approach means we can mix-and-match our instrumentation to meet your requirements.

Scanning electron microscopy (SEM) image of recrystallised nickel superalloy
Scanning electron microscopy (SEM) image of methicillin-resistant Staphylococcus aureus
Scanning electron microscopy (SEM) image of Borrelia burgdorferi bacteria, the pathogen behind Lyme disease
Leo 1430 variable pressure scanning electron microscope (SEM)

Scanning electron microscopy

Scanning electron microscopes (SEMs) are used to image the sample surface at up to 500,000X magnification. We have a range of SEMs equipped with a variety of detectors to give a wealth of supporting information.

Leo 1430 VP

  • Variable pressure for less conductive samples.
  • Cryo-SEM for imaging hydrated samples without distortions from dehydration, freeze-drying or chemical fixing.
  • Tungsten (W) filament for high resolution imaging of features greater than 100 nanometers.
  • Secondary electron (SE) detector for surface-sensitive imaging.
  • 4-quarter backscatter electron (BSE) detector for contrast from different materials.
  • Oxford instruments Energy-dispersive X-ray spectroscopy (EDX) for qualitative and quantitative analysis. Read more about EDX here.

Hitachi S-4000

  • Thermal field emission (TFE) for 10 nanometer resolution.
  • Secondary electron (SE) detector for surface-sensitive imaging.
  • Point Electronic DISS5 Digital Image Capture (DIC).

Hitachi S-2400

  • Tungsten (W) filament for high resolution imaging of features greater than 100 nanometers.
  • Secondary electron (SE) detector for surface-sensitive imaging.
  • 4-quarter backscatter electron (BSE) detector for contrast from different materials.
  • Point Electronic DISS5 Digital Image Capture (DIC) with dual-signal imaging.
High resolution transmission electron microscopy (HRTEM) image of a crystallite in a metal thin film
Transmission electron microscopy (TEM) image of the avian influenza virus
Transmission electron microscopy (TEM) image of the chikungunya virus transmitted by mosquitoes
Transmission electron microscopy (TEM) image of toxoplasmosis
Philips CM100 transmission electron microscope (TEM)

Transmission electron microscopy

Our TEMs are ideal for ultra-high-resolution imaging of materials from biological samples such as cells, nanoparticles and individual hydrogel fibres, through to solid state materials, metallurgy and crystallography.

Philips CM100

  • 40 – 100 kV with a LaB6 source for single nanometer resolution with minimal damage to beam sensitive materials.
  • Megaview II side-mounted camera.
  • Coming soon: Cryo-TEM for imaging hydrated samples without distortions from dehydration, freeze-drying or chemical fixing.
  • Dark field and diffraction mode for crystallographic analysis.

Jeol 2000FX

  • 200 kV with a LaB6 source for single nanometer resolution.
  • Gatan ES500W 1K x 1K camera.
  • Oxford instruments Energy-dispersive X-ray spectroscopy (EDX) for qualitative and quantitative analysis. Read more about EDX here.
  • Dark field and diffraction mode for crystallographic analysis.

Sample preparation

We have a full suite of sample preparation equipment for all kinds of samples, from biological specimens to electronics and metallography.

  • Sputter coating of carbon, gold or palladium to improve the resolution of non-conductive samples.
  • Ultra-microtome, resin embedding and sectioning between 30 – 100 nanometers thick for TEM samples.
  • Grinding and polishing for surface preparation of SEM samples and thinning of TEM samples.
  • Alpha Plasma AL-18 for oxygen/argon plasma cleaning and decapsulation.
  • Optical microscopy for finding the area of interest and evaluating sample preparation.

EM Analytical

Providing advanced imaging and characterisation services

Located at Alderley Park – The largest science park in the North West of England.

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